Electron Microscope and Spectroscopy System

JCC Day; R Bennett; A Bewick

Electron Microscope and Spectroscopy System

JCC Day (Inventor)
, R Bennett (Inventor)
, A Bewick (Inventor)

Interface Analysis Centre

Research output: Patent

Abstract

This invention relates to sample analysis systems. In a preferred embodiment an electron microscope is combined for example with a Raman, photoluminescence or cathodoluminescence spectroscopy system. This invention is embodied in the commercially available Renishaw SEMSCA SEM based Raman spectrometer.

Translated title of the contribution	Electron Microscope and Spectroscopy System
Original language	English
Patent number	02753131.9-2217-GB0203599
Publication status	Published - 5 Aug 2002

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External Body: EPO

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title = "Electron Microscope and Spectroscopy System",

abstract = "This invention relates to sample analysis systems. In a preferred embodiment an electron microscope is combined for example with a Raman, photoluminescence or cathodoluminescence spectroscopy system. This invention is embodied in the commercially available Renishaw SEMSCA SEM based Raman spectrometer.",

author = "JCC Day and R Bennett and A Bewick",

note = "External Body: EPO; 02753131.9-2217-GB0203599",

year = "2002",

month = aug,

day = "5",

language = "English",

type = "Patent",

}

TY - PAT

T1 - Electron Microscope and Spectroscopy System

AU - Day, JCC

AU - Bennett, R

AU - Bewick, A

N1 - External Body: EPO

PY - 2002/8/5

Y1 - 2002/8/5

N2 - This invention relates to sample analysis systems. In a preferred embodiment an electron microscope is combined for example with a Raman, photoluminescence or cathodoluminescence spectroscopy system. This invention is embodied in the commercially available Renishaw SEMSCA SEM based Raman spectrometer.

AB - This invention relates to sample analysis systems. In a preferred embodiment an electron microscope is combined for example with a Raman, photoluminescence or cathodoluminescence spectroscopy system. This invention is embodied in the commercially available Renishaw SEMSCA SEM based Raman spectrometer.

M3 - Patent

M1 - 02753131.9-2217-GB0203599

ER -

Electron Microscope and Spectroscopy System

Abstract

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