Translated title of the contribution | Electron microscopy of ultra-thin buried layers in InP and InGaAs |
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Original language | English |
Pages (from-to) | 121 - 126 |
Number of pages | 5 |
Journal | Phil. Mag |
Volume | A68 |
Publication status | Published - 1993 |
Electron microscopy of ultra-thin buried layers in InP and InGaAs
PN Grigorieff, D Cherns, MJ Yates, M Hickley, SD Perrin, MR Aylett
Research output: Contribution to journal › Article (Academic Journal) › peer-review
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