Electron microscopy studies of defects and electric fields in GaN structures

D Cherns

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionElectron microscopy studies of defects and electric fields in GaN structures
Original languageEnglish
Title of host publicationGaN Symposium in honour of the retirement of Professor I Akasaki, Nagoya, Japan, 3 November 2001
Pages38 - 48
Number of pages11
Publication statusPublished - 2001

Bibliographical note

Conference Proceedings/Title of Journal: Proc. of GaN Symposium
Conference Organiser: Meijo University, Nagoya
Other: Invited review

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