Electron microscopy studies of defects and electric fields in GaN structures

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Electron microscopy studies of defects and electric fields in GaN structures
Original language	English
Title of host publication	GaN Symposium in honour of the retirement of Professor I Akasaki, Nagoya, Japan, 3 November 2001
Pages	38 - 48
Number of pages	11
Publication status	Published - 2001

Conference Proceedings/Title of Journal: Proc. of GaN Symposium
Conference Organiser: Meijo University, Nagoya
Other: Invited review

Handle.net

@inproceedings{dfc4e9dfeabb4bfba184f813a4e8d951,

title = "Electron microscopy studies of defects and electric fields in GaN structures",

author = "D Cherns",

note = "Conference Proceedings/Title of Journal: Proc. of GaN Symposium Conference Organiser: Meijo University, Nagoya Other: Invited review",

year = "2001",

language = "English",

pages = "38 -- 48",

booktitle = "GaN Symposium in honour of the retirement of Professor I Akasaki, Nagoya, Japan, 3 November 2001",

}

TY - GEN

T1 - Electron microscopy studies of defects and electric fields in GaN structures

AU - Cherns, D

N1 - Conference Proceedings/Title of Journal: Proc. of GaN Symposium Conference Organiser: Meijo University, Nagoya Other: Invited review

PY - 2001

Y1 - 2001

M3 - Conference Contribution (Conference Proceeding)

SP - 38

EP - 48

BT - GaN Symposium in honour of the retirement of Professor I Akasaki, Nagoya, Japan, 3 November 2001

ER -