Electron microscopy studies of the structure and optoelectronic properties of defects in GaN

D Cherns

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Electron microscopy studies of the structure and optoelectronic properties of defects in GaN
Original language	English
Title of host publication	European Electron Microscopy Meeting, Lille, June 2002
Number of pages	2
Publication status	Published - 2002

Conference Organiser: European Microscopy Society
Other: Invited Review

Handle.net

@inproceedings{f09b34b8fd244e958f1ce7c0e4414fa8,

title = "Electron microscopy studies of the structure and optoelectronic properties of defects in GaN",

author = "D Cherns",

note = "Conference Organiser: European Microscopy Society Other: Invited Review",

year = "2002",

language = "English",

booktitle = "European Electron Microscopy Meeting, Lille, June 2002",

}