Abstract
Datareviews are given on the following topics: electron mobility in bulk and epitaxial Si; electron mobility in 2D n-type Si; electron mobility at (100) Si surface; minority carrier electron mobility, diffusion length and lifetime, in p-type Si
| Translated title of the contribution | Electron mobility, diffusion and lifetime [in silicon] |
|---|---|
| Original language | English |
| Title of host publication | Properties of silicon. EMIS datareviews series no.4 |
| Editors | del Alamo |
| Publisher | INSPEC |
| Pages | 121 - 149 |
| Number of pages | 29 |
| ISBN (Print) | 0852964757 |
| Publication status | Published - 1988 |
Research Groups and Themes
- Photonics and Quantum
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