Electron Trapping in GaN-on-Si Power HEMTs: Impact of Positive Substrate Bias

Michael J Uren, Markus Caesar, Indranil Chatterjee, Serge Karboyan, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens, P. Vanmeerbeek, Martin Kuball

Research output: Contribution to conferenceConference Abstract

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Abstract

[no short abstract for this paper]
Original languageEnglish
Number of pages2
Publication statusPublished - Aug 2015
EventEleventh International Conference on Networking and Services (ICNS 2015) - Rome, Italy
Duration: 24 May 201529 May 2015

Conference

ConferenceEleventh International Conference on Networking and Services (ICNS 2015)
CountryItaly
CityRome
Period24/05/1529/05/15

Structured keywords

  • CDTR

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