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Electron Trapping in GaN-on-Si Power HEMTs: Impact of Positive Substrate Bias

  • Michael J Uren
  • , Markus Caesar
  • , Indranil Chatterjee
  • , Serge Karboyan
  • , M. Meneghini
  • , G. Meneghesso
  • , E. Zanoni
  • , P. Moens
  • , P. Vanmeerbeek
  • , Martin Kuball

Research output: Contribution to conferenceConference Abstract

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Abstract

[no short abstract for this paper]
Original languageEnglish
Number of pages2
Publication statusPublished - Aug 2015
EventEleventh International Conference on Networking and Services (ICNS 2015) - Rome, Italy
Duration: 24 May 201529 May 2015

Conference

ConferenceEleventh International Conference on Networking and Services (ICNS 2015)
Country/TerritoryItaly
CityRome
Period24/05/1529/05/15

Research Groups and Themes

  • CDTR

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