@inproceedings{37a90b91e13541f080ed82d58d30c0a2,
title = "Electrothermal characterization of silicon-on-glass VDMOSFETs",
abstract = "In this paper silicon-on-glass VDMOSFETs are electrothermally characterized for the first time. The silicon-on-glass transistors are compared with the corresponding bulk-silicon devices by means of electrical measurements of the thermal resistance, and numerical thermal simulations. Very large values of R(TH) are measured on-wafer for each SOG VDMOSFET under test. Nevertheless, the simulations show that the electrothermal feedback is expected to be significantly reduced after the devices are mounted on a thermally conducting PCB. They indicate that the surface mounted SOG VDMOSFETs should have at least as good thermal stability as a bulk-Si VDIVIOSFET with the wafer thickness of only 100 mum.",
author = "N Nenadovic and H Schellevis and Cuoco, \{[No Value]\} and A Griffo and SJCH Theeuwen and LK Nanver and HFF Jos and JW Slotboom",
year = "2004",
language = "English",
isbn = "0-7803-8166-1",
series = "International Conference on Microelectronics-MIEL",
publisher = "IEEE Computer Society",
pages = "145--148",
booktitle = "2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2",
address = "United States",
note = "24th International Conference on Microelectronics (MIEL 2004) ; Conference date: 16-05-2004 Through 19-05-2004",
}