Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement

Argyrides Costas, Vargas Fabian, Dhiraj Pradhan

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

10 Citations (Scopus)
Translated title of the contributionEmbedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement
Original languageEnglish
Title of host publicationIEEE International On-Line Testing Symposium
Publication statusPublished - 2008

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: IEEE International On-Line Testing Symposium
Other identifier: 2000851

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