Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

10 Citations (Scopus)

Translated title of the contribution	Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement
Original language	English
Title of host publication	IEEE International On-Line Testing Symposium
Publication status	Published - 2008

Other page information: -
Conference Proceedings/Title of Journal: IEEE International On-Line Testing Symposium
Other identifier: 2000851

Access to Document

@inproceedings{6d293f377edd42cc97f589628e856b12,

title = "Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement",

author = "Argyrides Costas and Vargas Fabian and Dhiraj Pradhan",

note = "Other page information: - Conference Proceedings/Title of Journal: IEEE International On-Line Testing Symposium Other identifier: 2000851",

year = "2008",

language = "English",

booktitle = "IEEE International On-Line Testing Symposium",

}

TY - GEN

T1 - Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement

AU - Costas, Argyrides

AU - Fabian, Vargas

AU - Pradhan, Dhiraj

N1 - Other page information: - Conference Proceedings/Title of Journal: IEEE International On-Line Testing Symposium Other identifier: 2000851

PY - 2008

Y1 - 2008

M3 - Conference Contribution (Conference Proceeding)

BT - IEEE International On-Line Testing Symposium

ER -