EMI Generation Characteristics of SiC and Si Diodes: Influence of Reverse-Recovery Characteristics

Xibo Yuan, Sam D Walder, Niall F Oswald

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Original language	English
Journal	IEEE Transactions on Power Electronics
Early online date	18 Jul 2014
Publication status	E-pub ahead of print - 18 Jul 2014

Handle.net

@article{421115186fc04f9c98d4a75f06f91862,

title = "EMI Generation Characteristics of SiC and Si Diodes: Influence of Reverse-Recovery Characteristics",

author = "Xibo Yuan and Walder, \{Sam D\} and Oswald, \{Niall F\}",

year = "2014",

month = jul,

day = "18",

language = "English",

journal = "IEEE Transactions on Power Electronics",

issn = "0885-8993",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

}