EMI Generation Characteristics of SiC diodes: Influence of reverse recovery characteristics

Sam D Walder, Xibo Yuan, Niall F Oswald

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Original languageEnglish
Title of host publicationIET international conference on Power Electronics, Machines and Drives (PEMD)
Pages1-6
Number of pages6
Publication statusPublished - Apr 2014

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