Energy dissipation in tapping-mode scanning force microscopy with low quality factors

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Translated title of the contribution	Energy dissipation in tapping-mode scanning force microscopy with low quality factors
Original language	English
Pages (from-to)	3569 - 3571
Journal	Applied Physics Letters
Volume	75
Publication status	Published - 1999

Publisher: Applied Physics Letters

Handle.net

@article{36c5c9bf46f14b8b860b56246ac02207,

title = "Energy dissipation in tapping-mode scanning force microscopy with low quality factors",

author = "J Tamayo",

note = "Publisher: Applied Physics Letters",

year = "1999",

language = "English",

volume = "75",

pages = "3569 -- 3571",

journal = "Applied Physics Letters",

issn = "1077-3118",

publisher = "American Institute of Physics (AIP)",

}