Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching

C Marinelli; LJ Sargent; JM Rorison; RV Penty; IH White; PJ Heard; G Hasnain; RP Schneider

doi:10.1117/12.429784

Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching

C Marinelli
, LJ Sargent
, JM Rorison
, RV Penty
, IH White
, PJ Heard
, G Hasnain
, RP Schneider

Interface Analysis Centre

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

1 Citation (Scopus)

Translated title of the contribution	Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching
Original language	English
Title of host publication	SPIE Photonics West - In-Plane Semiconductor Lasers V, San Jose, CA, USA
Publisher	Society of Photo-Optical Instrumentation Engineers (SPIE)
Volume	4287 (57)
DOIs	https://doi.org/10.1117/12.429784
Publication status	Published - Apr 2001

Bibliographical note

Conference Organiser: SPIE

Research Groups and Themes

Photonics and Quantum

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10.1117/12.429784

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Cite this

Marinelli, C., Sargent, LJ., Rorison, JM., Penty, RV., White, IH., Heard, PJ., Hasnain, G., & Schneider, RP. (2001). Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching. In SPIE Photonics West - In-Plane Semiconductor Lasers V, San Jose, CA, USA (Vol. 4287 (57)). Society of Photo-Optical Instrumentation Engineers (SPIE). https://doi.org/10.1117/12.429784

@inproceedings{df2c3c79f94f4df58720192c3cd1a8ec,

title = "Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching",

author = "C Marinelli and LJ Sargent and JM Rorison and RV Penty and IH White and PJ Heard and G Hasnain and RP Schneider",

note = "Conference Organiser: SPIE",

year = "2001",

month = apr,

doi = "10.1117/12.429784",

language = "English",

volume = "4287 (57)",

booktitle = "SPIE Photonics West - In-Plane Semiconductor Lasers V, San Jose, CA, USA",

publisher = "Society of Photo-Optical Instrumentation Engineers (SPIE)",

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}

Marinelli, C, Sargent, LJ, Rorison, JM, Penty, RV, White, IH, Heard, PJ, Hasnain, G & Schneider, RP 2001, Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching. in SPIE Photonics West - In-Plane Semiconductor Lasers V, San Jose, CA, USA. vol. 4287 (57), Society of Photo-Optical Instrumentation Engineers (SPIE). https://doi.org/10.1117/12.429784

Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching. / Marinelli, C; Sargent, LJ; Rorison, JM et al.
SPIE Photonics West - In-Plane Semiconductor Lasers V, San Jose, CA, USA. Vol. 4287 (57) Society of Photo-Optical Instrumentation Engineers (SPIE), 2001.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching

AU - Marinelli, C

AU - Sargent, LJ

AU - Rorison, JM

AU - Penty, RV

AU - White, IH

AU - Heard, PJ

AU - Hasnain, G

AU - Schneider, RP

N1 - Conference Organiser: SPIE

PY - 2001/4

Y1 - 2001/4

U2 - 10.1117/12.429784

DO - 10.1117/12.429784

M3 - Conference Contribution (Conference Proceeding)

VL - 4287 (57)

BT - SPIE Photonics West - In-Plane Semiconductor Lasers V, San Jose, CA, USA

PB - Society of Photo-Optical Instrumentation Engineers (SPIE)

ER -

Marinelli C, Sargent LJ, Rorison JM, Penty RV, White IH, Heard PJ et al. Enhanced-performance operation of InGaN MQW lasers with air/nitride-distributed Bragg reflector defined by focused ion beam etching. In SPIE Photonics West - In-Plane Semiconductor Lasers V, San Jose, CA, USA. Vol. 4287 (57). Society of Photo-Optical Instrumentation Engineers (SPIE). 2001 doi: 10.1117/12.429784