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Abstract
The Transverse Dynamic Force Microscope (TDFM) is unique as it uses a vertical cantilever, and genuinely permits scans without physical interaction with a specimen. Recently, we suggested a simple control scheme for true noncontact scans using the TDFM. This control scheme implemented in FPGA-systems (Field-Programmable Gate Arrays) was developed for a non-contact control task at specific points above a given specimen, but dynamic specimen placement requirements in the horizontal plane through an x-y stage were neglected. Considering the large range of the specimen, a practical approach has been developed which reconfigures the fixed-point-arithmetic control implementation and permits a dynamic scan in true non-contact mode. For this, an off-line numerical optimization has been developed which establishes the most suitable fixed-point ranges of the control algorithm, avoiding algorithm overflow. This creates an implementation robust to plant and sensor non-linearities and dynamic changes during non-contact scans. Experimental non-contact scanning results, for nano-spheres in water, demonstrate the imaging capacity of the TDFM.
Original language | English |
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Title of host publication | American Control Conference 2018 (ACC 2018) |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Number of pages | 6 |
ISBN (Electronic) | 978-1-5386-5428-6 |
ISBN (Print) | 978-1-5386-5429-3 |
Publication status | E-pub ahead of print - 16 Aug 2018 |
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Dive into the research topics of 'Enhancing fixed-point control robustness for experimental non-contact scans with the Transverse-dynamic Force Microscope'. Together they form a unique fingerprint.Projects
- 1 Finished
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Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope
Herrmann, G. (Principal Investigator)
1/11/11 → 1/05/15
Project: Research