A Content Addressable Memory (CAM) is an SRAM based memory which can be accessed in parallel in order to search for a given search word, providing as result the address of the matching data. The use of CAM is widespread in many applications ranging from the controller of a CPU memory cache to the implementation of lookup tables of high speed routers. Like conventional memories, CAM can be affected by the occurrence of Single Event Upsets (SEU) which can alter its operation causing different effects such as pseudo-HIT or pseudo-MISS events. In order to avoid the effects of SEUs different approaches have been proposed in previous literature, but all of these solutions require changes to the internal structure of the CAM itself. Differently from previous approaches, in this paper we propose a method that does not require any modification to a CAM's internal structure and therefore can be easily applied at system level, using a suitable redundant CAM component in order to obtain a CAM module with error detection and correction capabilities.
|Title of host publication||Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems|
|Number of pages||9|
|Publication status||Published - 1 Dec 2010|
|Event||2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010 - Kyoto, United Kingdom|
Duration: 6 Oct 2010 → 8 Oct 2010
|Conference||2010 25th International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010|
|Period||6/10/10 → 8/10/10|