Error detection in ternary CAMs using bloom filters

Salvatore Pontarelli, Marco Ottavi, Adrian Evans, Shi Jie Wen

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

7 Citations (Scopus)

Abstract

This paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memories (TCAMs) based on the use of Bloom Filters. The proposed approach is described in detail and its performance results are presented. The advantages of the proposed method are that no modifications to the TCAM device are required, the checking is done on-line and the approach has low power and area overheads.

Original languageEnglish
Title of host publicationProceedings -Design, Automation and Test in Europe, DATE
Pages1474-1479
Number of pages6
Publication statusPublished - 21 Oct 2013
Event16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013 - Grenoble, United Kingdom
Duration: 18 Mar 201322 Mar 2013

Conference

Conference16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
CountryUnited Kingdom
CityGrenoble
Period18/03/1322/03/13

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  • Cite this

    Pontarelli, S., Ottavi, M., Evans, A., & Wen, S. J. (2013). Error detection in ternary CAMs using bloom filters. In Proceedings -Design, Automation and Test in Europe, DATE (pp. 1474-1479). [6513746]