This paper presents an innovative approach to detect soft errors in Ternary Content Addressable Memories (TCAMs) based on the use of Bloom Filters. The proposed approach is described in detail and its performance results are presented. The advantages of the proposed method are that no modifications to the TCAM device are required, the checking is done on-line and the approach has low power and area overheads.
|Title of host publication||Proceedings -Design, Automation and Test in Europe, DATE|
|Number of pages||6|
|Publication status||Published - 21 Oct 2013|
|Event||16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013 - Grenoble, United Kingdom|
Duration: 18 Mar 2013 → 22 Mar 2013
|Conference||16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013|
|Period||18/03/13 → 22/03/13|