Estimation of strain state in cross-sectional specimen of GexSi1-x/Si strained layered superlattices by large angle convergent beam electron diffraction

XF Duan, D Cherns, JW Steeds

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionEstimation of strain state in cross-sectional specimen of GexSi1-x/Si strained layered superlattices by large angle convergent beam electron diffraction
Original languageEnglish
Title of host publicationUnknown
Pages903 - 904
Number of pages1
Volume1
Publication statusPublished - 1994

Bibliographical note

Conference Proceedings/Title of Journal: 13th Int. Congress on Electron Microscopy

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