Estimation of strain state in cross-sectional specimen of GexSi1-x/Si strained layered superlattices by large angle convergent beam electron diffraction

XF Duan; D Cherns; JW Steeds

Estimation of strain state in cross-sectional specimen of Ge_xSi₁_-_x/Si strained layered superlattices by large angle convergent beam electron diffraction

XF Duan, D Cherns, JW Steeds

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Estimation of strain state in cross-sectional specimen of Ge_xSi₁_-_x/Si strained layered superlattices by large angle convergent beam electron diffraction
Original language	English
Title of host publication	Unknown
Pages	903 - 904
Number of pages	1
Volume	1
Publication status	Published - 1994

Bibliographical note

Conference Proceedings/Title of Journal: 13th Int. Congress on Electron Microscopy

Cite this

@inproceedings{3d63353c7b3640dab105e3ccf7540c81,

title = "Estimation of strain state in cross-sectional specimen of GexSi1-x/Si strained layered superlattices by large angle convergent beam electron diffraction",

author = "XF Duan and D Cherns and JW Steeds",

note = "Conference Proceedings/Title of Journal: 13th Int. Congress on Electron Microscopy",

year = "1994",

language = "English",

volume = "1",

pages = "903 -- 904",

booktitle = "Unknown",

}

TY - GEN

T1 - Estimation of strain state in cross-sectional specimen of GexSi1-x/Si strained layered superlattices by large angle convergent beam electron diffraction

AU - Duan, XF

AU - Cherns, D

AU - Steeds, JW

N1 - Conference Proceedings/Title of Journal: 13th Int. Congress on Electron Microscopy

PY - 1994

Y1 - 1994

M3 - Conference Contribution (Conference Proceeding)

VL - 1

SP - 903

EP - 904

BT - Unknown

ER -