Estimation of the Shear Force in Transverse Dynamic Force Microscopy Using a Sliding Mode Observer

Thang Nguyen Tien, Said G Khan, Christopher Edwards, Guido Herrmann, Loren M Picco, Robert L Harniman, Stuart C Burgess, Massimo Antognozzi, Mervyn J Miles

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

1 Citation (Scopus)
165 Downloads (Pure)

Abstract

This paper concerns the application of a sliding mode observer to the problem of estimation of the shear force affecting the cantilever dynamics of a Transverse Dynamic Force Microscope (TDFM). The oscillated cantilever in proximity to a specimen permits the investigation of the specimen topography at nano-metre precision. The oscillation amplitude, but also in particular the shear forces, are a measure of distance to the specimen, and therefore the estimation of the shear force is of significance when attempting to construct TDFM images at submolecular accuracy. For estimation of the shear forces, an approximate model of the cantilever is derived using the method of lines. Model order reduction and sliding mode techniques are employed to reconstruct the unknown shear force affecting the cantilever dynamics based on only tip position measurements. Simulations are presented to illustrate the proposed scheme, which is to be implemented on the TDFM set up at the Centre for NSQI at Bristol.
Original languageEnglish
Title of host publication2013 American Control Conference (ACC 2013)
Subtitle of host publicationProceedings of a meeting held 17-19 June 2013, Washington, DC, USA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages5494-5499
Number of pages6
ISBN (Electronic)9781479901784
ISBN (Print)9781479901777
DOIs
Publication statusPublished - Oct 2013

Publication series

NameProceedings of the American Control Conference
PublisherInstitute of Electrical and Electronics Engineers
ISSN (Print)0743-1619

Fingerprint Dive into the research topics of 'Estimation of the Shear Force in Transverse Dynamic Force Microscopy Using a Sliding Mode Observer'. Together they form a unique fingerprint.

Cite this