Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip

Mir Lodro; Francesco Raimondo; Mark A Beach

doi:10.1109/DySPAN64764.2025.11115949

Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip

Mir Lodro^*
, Francesco Raimondo
, Mark A Beach

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

16 Downloads (Pure)

Abstract

RF spectrum monitoring in a complex electromagnetic environment is a challenging task. In spectrum sensing, wideband RF equipment such as a radio frequency system on chip (RFSoC) is used to understand the incumbent spectrum occupancy. The measurements are targeted to understand the RF performance of ZYNQ Ultrascale+ Gen3 RFSoC 4x2, particularly the transmit power controlled via the digital to analog converter (DAC) variable output power (VOP) parameter and received signal attenuation controlled via the digital step attenuation (DSA) parameter. We measure the internal leakage from the analog to digital (ADC) channel with the input signal to other ADC channels with no input signal.

Original language	English
Title of host publication	2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	81-82
Number of pages	2
ISBN (Electronic)	9798331533625
ISBN (Print)	9798331533632
DOIs	https://doi.org/10.1109/DySPAN64764.2025.11115949
Publication status	Published - 19 Aug 2025
Event	IEEE International Symposium on Dynamic Spectrum Access Networks - London, United Kingdom Duration: 12 May 2025 → 16 May 2025 https://dyspan2025.ieee-dyspan.org/

Publication series

Name	IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN)
Publisher	IEEE
ISSN (Print)	2334-3125
ISSN (Electronic)	2473-070X

Conference

Conference	IEEE International Symposium on Dynamic Spectrum Access Networks
Abbreviated title	IEEE DySPAN 2025
Country/Territory	United Kingdom
City	London
Period	12/05/25 → 16/05/25
Internet address	https://dyspan2025.ieee-dyspan.org/

Bibliographical note

Publisher Copyright:
© 2025 IEEE.

Keywords

Radio Frequency System on chip (RFSoC)
RF Testing and Charachterization
Wideband Spectrum Monitoring
Direct Sampling
Resilient Transceivers

Access to Document

10.1109/DySPAN64764.2025.11115949

Full-text PDF (accepted manuscript)
This is the accepted author manuscript (AAM) of the article which has been made Open Access under the University of Bristol's Scholarly Works Policy. The final published version (Version of Record) can be found on the publisher's website. The copyright of any third-party content, such as images, remains with the copyright holder.
Accepted author manuscript, 2.46 MBLicence: CC BY

Handle.net

Persistent link

Cite this

Lodro, M., Raimondo, F., & Beach, M. A. (2025). Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip. In 2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN (pp. 81-82). (IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN)). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/DySPAN64764.2025.11115949

Lodro, Mir ; Raimondo, Francesco ; Beach, Mark A. / Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip. 2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN. Institute of Electrical and Electronics Engineers (IEEE), 2025. pp. 81-82 (IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN)).

@inproceedings{b626d038990443d1bef3521d856f09ff,

title = "Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip",

abstract = "RF spectrum monitoring in a complex electromagnetic environment is a challenging task. In spectrum sensing, wideband RF equipment such as a radio frequency system on chip (RFSoC) is used to understand the incumbent spectrum occupancy. The measurements are targeted to understand the RF performance of ZYNQ Ultrascale+ Gen3 RFSoC 4x2, particularly the transmit power controlled via the digital to analog converter (DAC) variable output power (VOP) parameter and received signal attenuation controlled via the digital step attenuation (DSA) parameter. We measure the internal leakage from the analog to digital (ADC) channel with the input signal to other ADC channels with no input signal.",

keywords = "Radio Frequency System on chip (RFSoC), RF Testing and Charachterization, Wideband Spectrum Monitoring, Direct Sampling, Resilient Transceivers",

author = "Mir Lodro and Francesco Raimondo and Beach, \{Mark A\}",

note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; IEEE International Symposium on Dynamic Spectrum Access Networks, IEEE DySPAN 2025 ; Conference date: 12-05-2025 Through 16-05-2025",

year = "2025",

month = aug,

day = "19",

doi = "10.1109/DySPAN64764.2025.11115949",

language = "English",

isbn = "9798331533632",

series = "IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

pages = "81--82",

booktitle = "2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN",

address = "United States",

url = "https://dyspan2025.ieee-dyspan.org/",

}

Lodro, M , Raimondo, F & Beach, MA 2025, Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip. in 2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN. IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN), Institute of Electrical and Electronics Engineers (IEEE), pp. 81-82, IEEE International Symposium on Dynamic Spectrum Access Networks, London, United Kingdom, 12/05/25. https://doi.org/10.1109/DySPAN64764.2025.11115949

Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip. / Lodro, Mir ; Raimondo, Francesco ; Beach, Mark A.
2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN. Institute of Electrical and Electronics Engineers (IEEE), 2025. p. 81-82 (IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN)).

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip

AU - Lodro, Mir

AU - Raimondo, Francesco

AU - Beach, Mark A

PY - 2025/8/19

Y1 - 2025/8/19

N2 - RF spectrum monitoring in a complex electromagnetic environment is a challenging task. In spectrum sensing, wideband RF equipment such as a radio frequency system on chip (RFSoC) is used to understand the incumbent spectrum occupancy. The measurements are targeted to understand the RF performance of ZYNQ Ultrascale+ Gen3 RFSoC 4x2, particularly the transmit power controlled via the digital to analog converter (DAC) variable output power (VOP) parameter and received signal attenuation controlled via the digital step attenuation (DSA) parameter. We measure the internal leakage from the analog to digital (ADC) channel with the input signal to other ADC channels with no input signal.

AB - RF spectrum monitoring in a complex electromagnetic environment is a challenging task. In spectrum sensing, wideband RF equipment such as a radio frequency system on chip (RFSoC) is used to understand the incumbent spectrum occupancy. The measurements are targeted to understand the RF performance of ZYNQ Ultrascale+ Gen3 RFSoC 4x2, particularly the transmit power controlled via the digital to analog converter (DAC) variable output power (VOP) parameter and received signal attenuation controlled via the digital step attenuation (DSA) parameter. We measure the internal leakage from the analog to digital (ADC) channel with the input signal to other ADC channels with no input signal.

KW - Radio Frequency System on chip (RFSoC)

KW - RF Testing and Charachterization

KW - Wideband Spectrum Monitoring

KW - Direct Sampling

KW - Resilient Transceivers

UR - https://dyspan2025.ieee-dyspan.org/

UR - https://ieeexplore.ieee.org/xpl/conhome/1001968/all-proceedings

U2 - 10.1109/DySPAN64764.2025.11115949

DO - 10.1109/DySPAN64764.2025.11115949

M3 - Conference Contribution (Conference Proceeding)

SN - 9798331533632

T3 - IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN)

SP - 81

EP - 82

BT - 2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN

PB - Institute of Electrical and Electronics Engineers (IEEE)

T2 - IEEE International Symposium on Dynamic Spectrum Access Networks

Y2 - 12 May 2025 through 16 May 2025

ER -

Lodro M , Raimondo F , Beach MA. Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip. In 2025 IEEE International Symposium on New Frontiers in Dynamic Spectrum Access Networks, DySPAN. Institute of Electrical and Electronics Engineers (IEEE). 2025. p. 81-82. (IEEE International Symposium on Dynamic Spectrum Access Networks (DySPAN)). doi: 10.1109/DySPAN64764.2025.11115949

Experimental Characterization of Power Level and Cross-channel Leakage on RF System-on-chip

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

Handle.net

Other files and links

Fingerprint

Cite this