Experimental Estimation of the Window of Vulnerability for Logic Circuits

NN Mahatme, NJ Gaspard, S Jagannathan, TD Loveless, I Chatterjee, BL Bhuva, LW Massengill, RD Schrimpf

Research output: Contribution to journalArticle (Academic Journal)peer-review

5 Citations (Scopus)
Original languageEnglish
Pages (from-to)2691-2696
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume60
Issue number4
Publication statusPublished - 2013

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