Experimental Estimation of the Window of Vulnerability for Logic Circuits

NN Mahatme, NJ Gaspard, S Jagannathan, TD Loveless, I Chatterjee, BL Bhuva, LW Massengill, RD Schrimpf

Research output: Contribution to journalArticle (Academic Journal)

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)2691-2696
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume60
Issue number4
Publication statusPublished - 2013

Cite this

Mahatme, NN., Gaspard, NJ., Jagannathan, S., Loveless, TD., Chatterjee, I., Bhuva, BL., Massengill, LW., & Schrimpf, RD. (2013). Experimental Estimation of the Window of Vulnerability for Logic Circuits. IEEE Transactions on Nuclear Science, 60(4), 2691-2696.