Abstract
This paper deals with the characterization of the differential carrier lifetime and the calculation of the monomolecular, radiative and non-radiative recombination coefficients and their temperature dependence as an evidence of the excellent temperature performance of this material system. The device characterized is a 1.25 μm GaInNAs laser structure grown on a GaAs substrate. The active region consists of a single 6 nm thick single quantum well. Light current (L-I) characteristics performed over a temperature range of 20°C to 80°C, show a characteristic temperature of 50 K. Similar than in the case of commercial InGaAs. Good temperature performance of optical gain using Hakki-Paoli method, lasing wavelength and efficiency will also be presented and compared with modelling work
| Translated title of the contribution | Experimental study of temperature sensitivity of carrier lifetime and recombination coefficients in GaInNAs SQW lasers |
|---|---|
| Original language | English |
| Title of host publication | 2005 Conference on Lasers and Electro-Optics Europe |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Pages | 303 - 303 |
| Number of pages | 1 |
| ISBN (Print) | 0780389743 |
| DOIs | |
| Publication status | Published - 12 Jun 2005 |
Research Groups and Themes
- Photonics and Quantum
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