|Translated title of the contribution||Extended and point defects in diamond studied with the aid of various forms of microscopy|
|Pages (from-to)||285 - 290|
|Journal||Proceedings: Microscopy and Microanalysis|
|Publication status||Published - 2000|
Bibliographical noteSpecial Issue: A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Steeds, JW., Charles, SJ., Gilmore, AC., & Butler, JE. (2000). Extended and point defects in diamond studied with the aid of various forms of microscopy. Proceedings: Microscopy and Microanalysis, 6, 285 - 290.