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Extension of {NVNA} Baseband Measurement for {PA} Characterization Under Complex Modulation

  • Yichi Zhang
  • , Xiaotao Guo
  • , Zhao He
  • , David Humphreys
  • , Lifeng Wang
  • , Wei Zhao
  • , Zilong Zhang

    Research output: Contribution to journalArticle (Academic Journal)peer-review

    10 Citations (Scopus)
    434 Downloads (Pure)

    Abstract

    Abstract—We investigated the measurement techniques of the
    nonlinear vector network analyzer (NVNA) test bench, to fully
    characterize the nonlinear behavior of radio frequency (RF)
    power amplifiers (PAs) driven by complex modulated signals.
    In order to extend the baseband measurements, two kinds of
    NVNA phase reference approaches are developed as alternative
    solutions, so that the baseband phase measurements can be
    achieved with those of modulated components at multiharmonic
    RF bands. In the first approach, a modulated baseband signal
    is combined with another modulated RF one to become the
    desired NVNA phase reference. While as an alternative solution,
    the second phase reference design is based on a “stepped”
    multisine, which is stepped through the baseband and each
    harmonic following the NVNA swept measurements, to achieve
    stable phase measurements. To validate these proposed NVNA
    test bench designs, an RF PA, driven by a large-signal long-term
    evolution-like multisine, was tested and compared with digital
    real-time oscilloscope measurements.
    Original languageEnglish
    Pages (from-to)1131
    Number of pages1141
    JournalIEEE Transactions on Microwave Theory and Techniques
    Volume66
    Issue number2
    DOIs
    Publication statusPublished - 1 Feb 2018

    Bibliographical note

    Publication organised by National Institute of Metrology, China and National Physical Laboratory, UK

    Keywords

    • Baseband measurements
    • nonlinear vector network analyzer (NVNA)
    • phase reference
    • phase standard
    • power amplifier (PA)

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