F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments

Stefano Campitelli; Marco Ottavi; Salvatore Pontarelli; Alessandro Marchioro; Daniele Felici; Fabrizio Lombardi

doi:10.1109/DFT.2013.6653591

F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments

Stefano Campitelli, Marco Ottavi, Salvatore Pontarelli, Alessandro Marchioro, Daniele Felici, Fabrizio Lombardi

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

19 Citations (Scopus)

Abstract

This paper introduces a novel design for a multiple node upset tolerant flip-flop. This design uses the TDICE memory cell that was proposed in the technical literature for memory arrays and applies its principles of operation to a Master Slave flip-flop implemented at 65 nm CMOS technology. It is shown that the proposed design approach is particularly suited for flip-flops targeting highly radioactive environments; simulation validates the multiple node upset tolerance and its viability. A test chip developed for the on-silicon validation is also described.

Original language	English
Title of host publication	Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Pages	107-111
Number of pages	5
DOIs	https://doi.org/10.1109/DFT.2013.6653591
Publication status	Published - 1 Dec 2013
Event	2013 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013 - New York City, NY, United Kingdom Duration: 2 Oct 2013 → 4 Oct 2013

Conference

Conference	2013 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013
Country/Territory	United Kingdom
City	New York City, NY
Period	2/10/13 → 4/10/13

Keywords

Flip flop
Multiple node upset
radiation

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10.1109/DFT.2013.6653591

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@inproceedings{1ea2569bed97419e8b4a8cdeebf84d97,

title = "F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments",

abstract = "This paper introduces a novel design for a multiple node upset tolerant flip-flop. This design uses the TDICE memory cell that was proposed in the technical literature for memory arrays and applies its principles of operation to a Master Slave flip-flop implemented at 65 nm CMOS technology. It is shown that the proposed design approach is particularly suited for flip-flops targeting highly radioactive environments; simulation validates the multiple node upset tolerance and its viability. A test chip developed for the on-silicon validation is also described.",

keywords = "Flip flop, Multiple node upset, radiation",

author = "Stefano Campitelli and Marco Ottavi and Salvatore Pontarelli and Alessandro Marchioro and Daniele Felici and Fabrizio Lombardi",

year = "2013",

month = dec,

day = "1",

doi = "10.1109/DFT.2013.6653591",

language = "English",

isbn = "9781479915835",

pages = "107--111",

booktitle = "Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",

note = "2013 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013 ; Conference date: 02-10-2013 Through 04-10-2013",

}

Campitelli, S, Ottavi, M, Pontarelli, S, Marchioro, A, Felici, D & Lombardi, F 2013, F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments. in Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems., 6653591, pp. 107-111, 2013 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013, New York City, NY, United Kingdom, 2/10/13. https://doi.org/10.1109/DFT.2013.6653591

F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments. / Campitelli, Stefano; Ottavi, Marco; Pontarelli, Salvatore et al.
Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. 2013. p. 107-111 6653591.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - F-DICE

T2 - 2013 26th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2013

AU - Campitelli, Stefano

AU - Ottavi, Marco

AU - Pontarelli, Salvatore

AU - Marchioro, Alessandro

AU - Felici, Daniele

AU - Lombardi, Fabrizio

PY - 2013/12/1

Y1 - 2013/12/1

N2 - This paper introduces a novel design for a multiple node upset tolerant flip-flop. This design uses the TDICE memory cell that was proposed in the technical literature for memory arrays and applies its principles of operation to a Master Slave flip-flop implemented at 65 nm CMOS technology. It is shown that the proposed design approach is particularly suited for flip-flops targeting highly radioactive environments; simulation validates the multiple node upset tolerance and its viability. A test chip developed for the on-silicon validation is also described.

AB - This paper introduces a novel design for a multiple node upset tolerant flip-flop. This design uses the TDICE memory cell that was proposed in the technical literature for memory arrays and applies its principles of operation to a Master Slave flip-flop implemented at 65 nm CMOS technology. It is shown that the proposed design approach is particularly suited for flip-flops targeting highly radioactive environments; simulation validates the multiple node upset tolerance and its viability. A test chip developed for the on-silicon validation is also described.

KW - Flip flop

KW - Multiple node upset

KW - radiation

UR - https://www.scopus.com/pages/publications/84891303068

U2 - 10.1109/DFT.2013.6653591

DO - 10.1109/DFT.2013.6653591

M3 - Conference Contribution (Conference Proceeding)

AN - SCOPUS:84891303068

SN - 9781479915835

SP - 107

EP - 111

BT - Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Y2 - 2 October 2013 through 4 October 2013

ER -

F-DICE: A multiple node upset tolerant flip-flop for highly radioactive environments

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