Abstract
Porous diamond (PD) films have been grown on sintered WC-13 wt.%Co substrates by bias enhanced hot filament (HF) chemical vapour deposition (CVD) methods and characterized by scanning electron microscopy (SEM), laser Raman spectroscopy and X-ray diffraction (XRD). The PD films show excellent adhesion under Rockwell indentation testing. Factors encouraging the growth of diamond film with high porosity are discussed. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Original language | English |
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Pages (from-to) | 2033-2037 |
Number of pages | 5 |
Journal | physica status solidi (a) |
Volume | 208 |
Issue number | 9 |
DOIs | |
Publication status | Published - Sept 2011 |