Failure Analysis for Ultra Low Power Nano-CMOS SRAM Under Process Variations

Jawar Singh, Jimson Mathew, Pradhan Dhiraj

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

3 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE International System On Chip Conference (SOCC’ 2008)
Publication statusPublished - 2008

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: IEEE International System On Chip Conference (SOCC’ 2008)
Other identifier: 2000889

Cite this

Singh, J., Mathew, J., & Dhiraj, P. (2008). Failure Analysis for Ultra Low Power Nano-CMOS SRAM Under Process Variations. In IEEE International System On Chip Conference (SOCC’ 2008) http://www.cs.bris.ac.uk/Publications/pub_master.jsp?id=2000889