Translated title of the contribution | Failure Analysis for Ultra Low Power Nano-CMOS SRAM Under Process Variations |
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Original language | English |
Title of host publication | IEEE International System On Chip Conference (SOCC’ 2008) |
Publication status | Published - 2008 |
Bibliographical note
Other page information: -Conference Proceedings/Title of Journal: IEEE International System On Chip Conference (SOCC’ 2008)
Other identifier: 2000889