Failure Analysis for Ultra Low Power Nano-CMOS SRAM Under Process Variations

Jawar Singh, Jimson Mathew, Pradhan Dhiraj

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

4 Citations (Scopus)
Translated title of the contributionFailure Analysis for Ultra Low Power Nano-CMOS SRAM Under Process Variations
Original languageEnglish
Title of host publicationIEEE International System On Chip Conference (SOCC’ 2008)
Publication statusPublished - 2008

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: IEEE International System On Chip Conference (SOCC’ 2008)
Other identifier: 2000889

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