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Failure Analysis for Ultra Low Power Nano-CMOS SRAM Under Process Variations

  • Jawar Singh
  • , Jimson Mathew
  • , Pradhan Dhiraj

    Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

    5 Citations (Scopus)
    Translated title of the contributionFailure Analysis for Ultra Low Power Nano-CMOS SRAM Under Process Variations
    Original languageEnglish
    Title of host publicationIEEE International System On Chip Conference (SOCC’ 2008)
    Publication statusPublished - 2008

    Bibliographical note

    Other page information: -
    Conference Proceedings/Title of Journal: IEEE International System On Chip Conference (SOCC’ 2008)
    Other identifier: 2000889

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