Translated title of the contribution | Fast Reed Muller Decoding for Multi-Bit Upset Aware Memory Designs |
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Original language | English |
Title of host publication | Proccedings of Latin American Test Workshop (LATW) |
Publication status | Published - 2007 |
Bibliographical note
Other page information: -Conference Proceedings/Title of Journal: Proccedings of Latin American Test Workshop (LATW)
Other identifier: 2000674