Feedback-based Coverage Directed test Generation: An industrial evaluation

Charalambos Ioannides; Geoff Barrett; Kerstin Eder

doi:10.1007/978-3-642-19583-9

Feedback-based Coverage Directed test Generation: An industrial evaluation

Charalambos Ioannides, Geoff Barrett, Kerstin Eder

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

13 Citations (Scopus)

508 Downloads (Pure)

Abstract

Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.

Translated title of the contribution	Feedback-based Coverage Directed Test Generation: An industrial evaluation
Original language	English
Title of host publication	Hardware and Software: Verification and Testing
Subtitle of host publication	6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers
Editors	Sharon Barner, Ian Harris, Daniel Kroening, Orna Raz
Publisher	Springer
Pages	112-128
Number of pages	27
ISBN (Electronic)	9783642195839
ISBN (Print)	9783642195822
DOIs	https://doi.org/10.1007/978-3-642-19583-9
Publication status	Published - 2011
Event	6th Haifa Verification Conference (HVC) - Haifa, Israel Duration: 1 Oct 2010 → …

Publication series

Name	Lecture Notes in Computer Science
Publisher	Springer Berlin Heidelberg
Volume	6504
ISSN (Print)	0302-9743
ISSN (Electronic)	1611-3349

Conference

Conference	6th Haifa Verification Conference (HVC)
Country/Territory	Israel
City	Haifa
Period	1/10/10 → …

Bibliographical note

Other page information: tbc-
Conference Proceedings/Title of Journal: HVC 2010
Other identifier: 2001285
Rose publication type: Conference contribution

Additional information: Author's own version of a paper published by Springer. The original publication is available at www.springerlink.com

Sponsorship: EPSRC

Contributor (Other): IBM Research Labs, Israel
ISSN: 03029743 (print), 16113349 (online)

Keywords

microprocessor verification
MicroGP
genetic programming
Coverage Directed test Generation

Access to Document

10.1007/978-3-642-19583-9

Feedback-based coverageAccepted author manuscript, 483 KB

http://www.cs.bris.ac.uk/Publications/pub_master.jsp?id=2001285

Handle.net

Persistent link

Cite this

Ioannides, C., Barrett, G., & Eder, K. (2011). Feedback-based Coverage Directed test Generation: An industrial evaluation. In S. Barner, I. Harris, D. Kroening, & O. Raz (Eds.), Hardware and Software: Verification and Testing: 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers (pp. 112-128). (Lecture Notes in Computer Science; Vol. 6504). Springer. https://doi.org/10.1007/978-3-642-19583-9

Ioannides, Charalambos ; Barrett, Geoff ; Eder, Kerstin. / Feedback-based Coverage Directed test Generation : An industrial evaluation. Hardware and Software: Verification and Testing: 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers. editor / Sharon Barner ; Ian Harris ; Daniel Kroening ; Orna Raz. Springer, 2011. pp. 112-128 (Lecture Notes in Computer Science).

@inproceedings{878a246331994e05bda54edb5bb1b2fa,

title = "Feedback-based Coverage Directed test Generation: An industrial evaluation",

abstract = "Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.",

keywords = "microprocessor verification, MicroGP, genetic programming, Coverage Directed test Generation",

author = "Charalambos Ioannides and Geoff Barrett and Kerstin Eder",

note = "Other page information: tbc- Conference Proceedings/Title of Journal: HVC 2010 Other identifier: 2001285 Rose publication type: Conference contribution Additional information: Author's own version of a paper published by Springer. The original publication is available at www.springerlink.com Sponsorship: EPSRC Contributor (Other): IBM Research Labs, Israel ISSN: 03029743 (print), 16113349 (online); 6th Haifa Verification Conference (HVC) ; Conference date: 01-10-2010",

year = "2011",

doi = "10.1007/978-3-642-19583-9",

language = "English",

isbn = "9783642195822",

series = "Lecture Notes in Computer Science",

publisher = "Springer",

pages = "112--128",

editor = "Barner, { Sharon} and Ian Harris and Daniel Kroening and Orna Raz",

booktitle = "Hardware and Software: Verification and Testing",

}

Ioannides, C, Barrett, G & Eder, K 2011, Feedback-based Coverage Directed test Generation: An industrial evaluation. in S Barner, I Harris, D Kroening & O Raz (eds), Hardware and Software: Verification and Testing: 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers. Lecture Notes in Computer Science, vol. 6504, Springer, pp. 112-128, 6th Haifa Verification Conference (HVC), Haifa, Israel, 1/10/10. https://doi.org/10.1007/978-3-642-19583-9

Feedback-based Coverage Directed test Generation: An industrial evaluation. / Ioannides, Charalambos; Barrett, Geoff; Eder, Kerstin.
Hardware and Software: Verification and Testing: 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers. ed. / Sharon Barner; Ian Harris; Daniel Kroening; Orna Raz. Springer, 2011. p. 112-128 (Lecture Notes in Computer Science; Vol. 6504).

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Feedback-based Coverage Directed test Generation

T2 - 6th Haifa Verification Conference (HVC)

AU - Ioannides, Charalambos

AU - Barrett, Geoff

AU - Eder, Kerstin

N1 - Other page information: tbc- Conference Proceedings/Title of Journal: HVC 2010 Other identifier: 2001285 Rose publication type: Conference contribution Additional information: Author's own version of a paper published by Springer. The original publication is available at www.springerlink.com Sponsorship: EPSRC Contributor (Other): IBM Research Labs, Israel ISSN: 03029743 (print), 16113349 (online)

PY - 2011

Y1 - 2011

N2 - Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.

AB - Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.

KW - microprocessor verification

KW - MicroGP

KW - genetic programming

KW - Coverage Directed test Generation

U2 - 10.1007/978-3-642-19583-9

DO - 10.1007/978-3-642-19583-9

M3 - Conference Contribution (Conference Proceeding)

SN - 9783642195822

T3 - Lecture Notes in Computer Science

SP - 112

EP - 128

BT - Hardware and Software: Verification and Testing

A2 - Barner, Sharon

A2 - Harris, Ian

A2 - Kroening, Daniel

A2 - Raz, Orna

PB - Springer

Y2 - 1 October 2010

ER -

Ioannides C, Barrett G, Eder K. Feedback-based Coverage Directed test Generation: An industrial evaluation. In Barner S, Harris I, Kroening D, Raz O, editors, Hardware and Software: Verification and Testing: 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers. Springer. 2011. p. 112-128. (Lecture Notes in Computer Science). doi: 10.1007/978-3-642-19583-9

Feedback-based Coverage Directed test Generation: An industrial evaluation

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

Handle.net

Fingerprint

Cite this