Feedback-based Coverage Directed test Generation: An industrial evaluation

Charalambos Ioannides, Geoff Barrett, Kerstin Eder

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

13 Citations (Scopus)
441 Downloads (Pure)


Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.
Translated title of the contributionFeedback-based Coverage Directed Test Generation: An industrial evaluation
Original languageEnglish
Title of host publicationHardware and Software: Verification and Testing
Subtitle of host publication6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers
Editors Sharon Barner, Ian Harris, Daniel Kroening, Orna Raz
Number of pages27
ISBN (Electronic)9783642195839
ISBN (Print)9783642195822
Publication statusPublished - 2011
Event6th Haifa Verification Conference (HVC) - Haifa, Israel
Duration: 1 Oct 2010 → …

Publication series

NameLecture Notes in Computer Science
PublisherSpringer Berlin Heidelberg
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349


Conference6th Haifa Verification Conference (HVC)
Period1/10/10 → …

Bibliographical note

Other page information: tbc-
Conference Proceedings/Title of Journal: HVC 2010
Other identifier: 2001285
Rose publication type: Conference contribution

Additional information: Author's own version of a paper published by Springer. The original publication is available at

Sponsorship: EPSRC

Contributor (Other): IBM Research Labs, Israel
ISSN: 03029743 (print), 16113349 (online)


  • microprocessor verification
  • MicroGP
  • genetic programming
  • Coverage Directed test Generation


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