FEG-EPMA of solid state redox sensors - The effect of secondary fluorescence on analytical precision

Jon Wade; Ben Buse; Stuart Kearns

doi:10.1017/S1431927614005364

FEG-EPMA of solid state redox sensors - The effect of secondary fluorescence on analytical precision

Jon Wade, Ben Buse, Stuart Kearns

Research output: Contribution to journal › Article (Academic Journal) › peer-review

2 Citations (Scopus)

Original language	English
Pages (from-to)	728-729
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614005364
Publication status	Published - 1 Jan 2014

Access to Document

10.1017/S1431927614005364

Handle.net

Persistent link

Cite this

@article{f9a7e6eaf8344ecd85802b45b626fc9d,

title = "FEG-EPMA of solid state redox sensors - The effect of secondary fluorescence on analytical precision",

author = "Jon Wade and Ben Buse and Stuart Kearns",

year = "2014",

month = jan,

day = "1",

doi = "10.1017/S1431927614005364",

language = "English",

volume = "20",

pages = "728--729",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

}

TY - JOUR

T1 - FEG-EPMA of solid state redox sensors - The effect of secondary fluorescence on analytical precision

AU - Wade, Jon

AU - Buse, Ben

AU - Kearns, Stuart

PY - 2014/1/1

Y1 - 2014/1/1

UR - http://www.scopus.com/inward/record.url?scp=84922433806&partnerID=8YFLogxK

U2 - 10.1017/S1431927614005364

DO - 10.1017/S1431927614005364

M3 - Article (Academic Journal)

AN - SCOPUS:84922433806

SN - 1431-9276

VL - 20

SP - 728

EP - 729

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

ER -

FEG-EPMA of solid state redox sensors - The effect of secondary fluorescence on analytical precision

Access to Document

Handle.net

Other files and links

Cite this