Focused ion beam polishing of GaInSb/AIGaInSb strained laser facets

SJB Przeslak; JR Pugh; GR Nash; MJ Cryan; JG Rarity; PJ Heard; SJ Smith; CJ Storey; AD Andreev; SD Coomber; L Buckle; MT Emeny; T Ashley

Focused ion beam polishing of GaInSb/AIGaInSb strained laser facets

SJB Przeslak, JR Pugh, GR Nash, MJ Cryan, JG Rarity, PJ Heard, SJ Smith, CJ Storey, AD Andreev, SD Coomber, L Buckle, MT Emeny, T Ashley

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Focused ion beam polishing of GaInSb/AIGaInSb strained laser facets
Original language	English
Title of host publication	International Conference on Mid-Infrared Optoelectronics: Materials and Devices (MIOMD-IX), Freiburg, Germany
Publication status	Published - 7 Sept 2008

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@inproceedings{4996cd5efa104cc1820554d502125f8c,

title = "Focused ion beam polishing of GaInSb/AIGaInSb strained laser facets",

author = "SJB Przeslak and JR Pugh and GR Nash and MJ Cryan and JG Rarity and PJ Heard and SJ Smith and CJ Storey and AD Andreev and SD Coomber and L Buckle and MT Emeny and T Ashley",

year = "2008",

month = sep,

day = "7",

language = "English",

booktitle = "International Conference on Mid-Infrared Optoelectronics: Materials and Devices (MIOMD-IX), Freiburg, Germany",

}

TY - GEN

T1 - Focused ion beam polishing of GaInSb/AIGaInSb strained laser facets

AU - Przeslak, SJB

AU - Pugh, JR

AU - Nash, GR

AU - Cryan, MJ

AU - Rarity, JG

AU - Heard, PJ

AU - Smith, SJ

AU - Storey, CJ

AU - Andreev, AD

AU - Coomber, SD

AU - Buckle, L

AU - Emeny, MT

AU - Ashley, T

PY - 2008/9/7

Y1 - 2008/9/7

M3 - Conference Contribution (Conference Proceeding)

BT - International Conference on Mid-Infrared Optoelectronics: Materials and Devices (MIOMD-IX), Freiburg, Germany

ER -