Growth Temperature Dependence of the LaAlO(3)/SrTiO(3) Interfacial Structure

Yusuke Wakabayashi*, Yoshihiro Yamasaki, Christopher Bell, Yasuyuki Hikita, Harold Y. Hwang, Tsuyoshi Kimura, Chris Bell

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

1 Citation (Scopus)

Abstract

The growth temperature dependence of the interfacial structure of LaAlO(3) thin films on SrTiO(3) substrates is clearly observed by means of surface x-ray diffraction, combined with a holographic analysis. Although the interfacial structure that is tuned by the fabrication condition is known as a key to the control of various film properties, such a minute change in structure has not been studied in detail. Our observations show that a microscopic evaluation of the interfacial structure, as a function of the growth conditions, is achievable.

Original languageEnglish
Title of host publicationINTERNATIONAL CONFERENCE ON FRUSTRATION IN CONDENSED MATTER (ICFCM)
EditorsHA Katori, H Kawamura, TH Arima, S Fujiyama
Place of PublicationBRISTOL
PublisherDeutsche Physikalische Gesellschaft & IOP Publishing Ltd
Number of pages4
DOIs
Publication statusPublished - 2011
EventInternational Conference on Frustration in Condensed Matter (ICFCM) - Sendai, Japan
Duration: 11 Jan 201114 Jan 2011

Publication series

NameJournal of Physics Conference Series
PublisherIOP PUBLISHING LTD
Volume320
ISSN (Print)1742-6588

Conference

ConferenceInternational Conference on Frustration in Condensed Matter (ICFCM)
Country/TerritoryJapan
Period11/01/1114/01/11

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