Harnessing biased faults in attacks on ECC-based signature schemes

Kimmo Järvinen, Celine Blondeau, Daniel Page, Mike Tunstall

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

8 Citations (Scopus)
Original languageEnglish
Title of host publicationFault Diagnosis and Tolerance in Cryptography - FDTC 2012
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages72-82
Publication statusPublished - 2012

Cite this

Järvinen, K., Blondeau, C., Page, D., & Tunstall, M. (2012). Harnessing biased faults in attacks on ECC-based signature schemes. In Fault Diagnosis and Tolerance in Cryptography - FDTC 2012 (pp. 72-82). Institute of Electrical and Electronics Engineers (IEEE).