Harnessing biased faults in attacks on ECC-based signature schemes

Kimmo Järvinen, Celine Blondeau, Daniel Page, Mike Tunstall

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

8 Citations (Scopus)

Original language	English
Title of host publication	Fault Diagnosis and Tolerance in Cryptography - FDTC 2012
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	72-82
Publication status	Published - 2012

Handle.net

@inproceedings{483d70e027bf49c985f2c5911efcb69b,

title = "Harnessing biased faults in attacks on ECC-based signature schemes",

author = "Kimmo J{\"a}rvinen and Celine Blondeau and Daniel Page and Mike Tunstall",

year = "2012",

language = "English",

pages = "72--82",

booktitle = "Fault Diagnosis and Tolerance in Cryptography - FDTC 2012",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Harnessing biased faults in attacks on ECC-based signature schemes. / Järvinen, Kimmo; Blondeau, Celine; Page, Daniel et al.
Fault Diagnosis and Tolerance in Cryptography - FDTC 2012. Institute of Electrical and Electronics Engineers (IEEE), 2012. p. 72-82.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Harnessing biased faults in attacks on ECC-based signature schemes

AU - Järvinen, Kimmo

AU - Blondeau, Celine

AU - Page, Daniel

AU - Tunstall, Mike

PY - 2012

Y1 - 2012

M3 - Conference Contribution (Conference Proceeding)

SP - 72

EP - 82

BT - Fault Diagnosis and Tolerance in Cryptography - FDTC 2012

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -