Harnessing biased faults in attacks on ECC-based signature schemes

Kimmo Järvinen, Celine Blondeau, Daniel Page, Mike Tunstall

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

8 Citations (Scopus)
Original languageEnglish
Title of host publicationFault Diagnosis and Tolerance in Cryptography - FDTC 2012
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Publication statusPublished - 2012

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