Abstract
Heterogenous integration of materials and devices opens huge opportunities for exploiting device structures which benefit from an optimal combination of electronic and thermal material properties. It is critically important to assess heat transfer across their interfaces to avoid thermal bottlenecks resulting in excessive device temperatures though. Experimental techniques to assess thermal conductivity of materials and thermal boundary resistance between materials are reviewed, with examples from GaN-on-Diamond, diamond to metal diamond composites.
| Original language | English |
|---|---|
| Title of host publication | 2021 7th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Number of pages | 1 |
| ISBN (Electronic) | 9781665405676 |
| ISBN (Print) | 9781665405683 |
| DOIs | |
| Publication status | Published - 9 Nov 2021 |
| Event | 7th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) - Online Duration: 5 Oct 2021 → 11 Oct 2021 Conference number: 21462758 https://imsi.jp/ltb3d/ltb3d-2021/ |
Conference
| Conference | 7th International Workshop on Low Temperature Bonding for 3D Integration (LTB-3D) |
|---|---|
| Abbreviated title | LTB-3D |
| Period | 5/10/21 → 11/10/21 |
| Internet address |
Research Groups and Themes
- CDTR
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