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Hexaferrite Substrate Versus Impedance Matching for Tuneable Patch Antenna Miniaturisation

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2018 12th European Conference on Antennas and Propagation, EuCAP 2018
Publisher or commissioning bodyInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages5
ISBN (Electronic)9781785618161
ISBN (Print)9781785618154
DOIs
DateAccepted/In press - 18 Dec 2017
DateE-pub ahead of print (current) - 10 Dec 2018
Event12th European Conference on Antennas and Propagation - London, United Kingdom
Duration: 9 Apr 201813 Apr 2018
Conference number: 12
http://www.eucap2018.org/

Conference

Conference12th European Conference on Antennas and Propagation
Abbreviated titleEuCAP
CountryUnited Kingdom
CityLondon
Period9/04/1813/04/18
Internet address

Abstract

Novel hexaferrite substrates and impedance matching networks are both means to deliver electrically small antennas (ESAs). The performance characteristics of each are often restricted to a discussion on the reflection coefficient S11, without consideration of full radiative characterisation. In this work the radiation efficiency and pattern of a hexaferrite patch ESA and impedance-matched sub-resonant Rogers RT5880 patch were compared. The efficiencies of each technique were found to be low, while the pattern of the sub-resonant patch displayed considerable divergence from the half-wavelength behaviour of the hexaferrite patch. The stability of the magnetically-tuned radiation pattern of the hexaferrite patch was then demonstrated over a tuned bandwidth of 32.1%.

    Research areas

  • Electrically small antennas, hexagonal ferrite, reconfigurable antennas, tuning, UHF antennas

Event

12th European Conference on Antennas and Propagation

Abbreviated titleEuCAP
Conference number12
Duration9 Apr 201813 Apr 2018
CityLondon
CountryUnited Kingdom
Web address (URL)
Degree of recognitionInternational event

Event: Conference

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Documents

Documents

  • Full-text PDF (accepted author manuscript)

    Rights statement: This is the author accepted manuscript (AAM). The final published version (version of record) is available online via IEEE at https://ieeexplore.ieee.org/document/8568367 . Please refer to any applicable terms of use of the publisher.

    Accepted author manuscript, 2.43 MB, PDF document

DOI

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