High-Bandwidth, High-Fidelity In-Circuit Measurement of Power Electronic Switching Waveforms for EMI Generation Analysis

Niall F Oswald, BH Stark, JN McNeill, DMJ Holliday

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

9 Citations (Scopus)

Abstract

The useful bandwidth of power electronic switching waveform measurements is limited by the finite resolution of measurement instrumentation and the spectral characteristics of switching waveforms, which exhibit a steep roll-off with increasing frequency. This limits the use of such measurements in EMI generation analysis, simulation and prediction. A method combining PC-based offline data processing and highpass filtering of the waveforms prior to measurement allows the useful measurement bandwidth to be extended to 100 MHz in the case of a 1200 V, 15 A IGBT operating under realistic conditions. When utilised with commercially available current probes and passive voltage probes, this method offers highfidelity measurements. However, it is more difficult to obtain repeatable measurements with high-voltage differential probes. The resulting spectra of IGBT collector-emitter voltage and collector current waveforms are presented; the increased bandwidth allows the high-frequency spectral gradient of -60 dB/decade to be observed across the 30-100 MHz band most critical for radiated EMI generation in IGBT-based power converters. The effect of series gate resistance variation is thus apparent, and spectral evidence is provided for the 30-100 MHz band being dominated by the turn-on transients with small gate resistances, and by the turn-off transients with large gate resistances.
Translated title of the contributionHigh-Bandwidth, High-Fidelity In-Circuit Measurement of Power Electronic Switching Waveforms for EMI Generation Analysis
Original languageEnglish
Title of host publicationIEEE Energy Conversion Congress & Exposition, Phoenix, AZ, USA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages3886 - 3893
Number of pages8
ISBN (Print)9781457705427
DOIs
Publication statusPublished - 2011

Bibliographical note

Conference Proceedings/Title of Journal: Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
Conference Organiser: IEEE PELS/IEEE IAS

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  • Cite this

    Oswald, N. F., Stark, BH., McNeill, JN., & Holliday, DMJ. (2011). High-Bandwidth, High-Fidelity In-Circuit Measurement of Power Electronic Switching Waveforms for EMI Generation Analysis. In IEEE Energy Conversion Congress & Exposition, Phoenix, AZ, USA (pp. 3886 - 3893). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ECCE.2011.6064297