High Pressure Scanning Electron Microscopy: What it Can and Cannot do

JS Shah

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionHigh Pressure Scanning Electron Microscopy: What it Can and Cannot do
Original languageEnglish
Title of host publicationIn European Conference on Applications of Surface and Interface Analysis, Montreux. ed. by H.J. Mathieu et al
PublisherJohn Wiley & Sons, Ltd.
Pages345 - 352
ISBN (Print)0471958999
Publication statusPublished - 1996

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