High-speed atomic force microscopy in slow motion-understanding cantilever behaviour at high scan velocities

O. D. Payton*, L. Picco, D. Robert, A. Raman, M. E. Homer, A. R. Champneys, M. J. Miles

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

29 Citations (Scopus)

Abstract

Using scanning laser Doppler vibrometer we have identified sources of noise in contact mode high-speed atomic force microscope images and the cantilever dynamics that cause them. By analysing reconstructed animations of the entire cantilever passing over various surfaces, we identified higher eigenmode oscillations along the cantilever as the cause of the image artefacts. We demonstrate that these can be removed by monitoring the displacement rather than deflection of the tip of the cantilever. We compare deflection and displacement detection methods whilst imaging a calibration grid at high speed and show the significant advantage of imaging using displacement.

Translated title of the contributionHigh-speed atomic force microscopy in slow motion-understanding cantilever behaviour at high scan velocities
Original languageEnglish
Article number205704
Number of pages6
JournalNanotechnology
Volume23
Issue number20
DOIs
Publication statusPublished - 25 May 2012

Bibliographical note

Other identifier: 205704

Keywords

  • DYNAMICS

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  • Purdue University

    Oliver D Payton (Visiting researcher)

    3 Mar 201310 Mar 2013

    Activity: Visiting an external institution typesVisiting an external academic institution

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