Highly Reliable Power Aware Memory Design

Argyrides Costas; Dhiraj Pradhan

Highly Reliable Power Aware Memory Design

Argyrides Costas
, Dhiraj Pradhan

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

1 Citation (Scopus)

Translated title of the contribution	Highly Reliable Power Aware Memory Design
Original language	English
Title of host publication	EEE International On-Line Testing Symposium 2007 (IOLTS)
Publication status	Published - 2007

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: EEE International On-Line Testing Symposium 2007 (IOLTS)
Other identifier: 2000729

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http://www.cs.bris.ac.uk/Publications/pub_master.jsp?id=2000729

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Cite this

@inproceedings{16b77e4abaa34854a4d5133fc1a50471,

title = "Highly Reliable Power Aware Memory Design",

author = "Argyrides Costas and Dhiraj Pradhan",

note = "Other page information: - Conference Proceedings/Title of Journal: EEE International On-Line Testing Symposium 2007 (IOLTS) Other identifier: 2000729",

year = "2007",

language = "English",

booktitle = "EEE International On-Line Testing Symposium 2007 (IOLTS)",

}

TY - GEN

T1 - Highly Reliable Power Aware Memory Design

AU - Costas, Argyrides

AU - Pradhan, Dhiraj

N1 - Other page information: - Conference Proceedings/Title of Journal: EEE International On-Line Testing Symposium 2007 (IOLTS) Other identifier: 2000729

PY - 2007

Y1 - 2007

M3 - Conference Contribution (Conference Proceeding)

BT - EEE International On-Line Testing Symposium 2007 (IOLTS)

ER -