Abstract
Efficient and effective testing for simulation-based hardware verification is challenging. Using constrained random test generation, several millions of tests may be required to achieve coverage goals. The vast majority of tests do not contribute to coverage progress, yet they consume verification resources. In this paper, we propose a hybrid intelligent testing approach combining two methods that have previously been treated separately, namely Coverage-Directed Test Selection and Novelty-Driven Verification. Coverage-Directed Test Selection learns from coverage feedback to bias testing towards the most effective tests. Novelty-Driven Verification learns to identify and simulate stimuli that differ from previous stimuli, thereby reducing the number of simulations and increasing testing efficiency. We discuss the strengths and limitations of each method, and we show how our approach addresses each method's limitations, leading to hardware testing that is both efficient and effective.
Original language | English |
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Title of host publication | 2022 IEEE International Conference On Artificial Intelligence Testing (AITest) |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 26-33 |
Number of pages | 8 |
ISBN (Electronic) | 9781665487375 |
DOIs | |
Publication status | Published - 26 Sept 2022 |
Event | IEEE AITest 2022: THE 4TH IEEE INTERNATIONAL CONFERENCE ON ARTIFICIAL INTELLIGENCE TESTING - DoubleTree hotel, Newark-Fremont, CA, United States Duration: 15 Aug 2022 → 18 Aug 2022 Conference number: 4 https://ieeetests.com/ http://ieeetests.com/?p=115 |
Publication series
Name | International Conference on Artificial Intelligence Testing |
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Publisher | IEEE |
ISSN (Print) | 2835-3552 |
ISSN (Electronic) | 2835-3560 |
Conference
Conference | IEEE AITest 2022 |
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Country/Territory | United States |
City | Newark-Fremont, CA |
Period | 15/08/22 → 18/08/22 |
Internet address |
Bibliographical note
Publisher Copyright:© 2022 IEEE.
Keywords
- Design Verification
- Intelligent Testing
- Coverage-Directed Test Selection
- Novelty-Driven Verification
- Machine Learning for Verification
- CDS
- CDG
- EDA