Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches

M Bockstedte; A Gali; A Mattausch; O Pankratov; JW Steeds

doi:10.1002/pssb.200844048

Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches

M Bockstedte, A Gali, A Mattausch, O Pankratov, JW Steeds

Research output: Contribution to journal › Article (Academic Journal) › peer-review

42 Citations (Scopus)

Translated title of the contribution	Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches
Original language	English
Pages (from-to)	1281 - 1297
Number of pages	17
Journal	physica status solidi (b)
Volume	245(7)
DOIs	https://doi.org/10.1002/pssb.200844048
Publication status	Published - Jun 2008

Bibliographical note

Publisher: Wiley Interscience
Other: Special Issue: Silicon Carbide: Current Trends in Research and Applications

Access to Document

10.1002/pssb.200844048

Cite this

@article{7537250a61054493917d026f15d76f59,

title = "Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches",

author = "M Bockstedte and A Gali and A Mattausch and O Pankratov and JW Steeds",

note = "Publisher: Wiley Interscience Other: Special Issue: Silicon Carbide: Current Trends in Research and Applications",

year = "2008",

month = jun,

doi = "10.1002/pssb.200844048",

language = "English",

volume = "245(7)",

pages = "1281 -- 1297",

journal = "physica status solidi (b)",

issn = "0370-1972",

publisher = "Wiley-VCH Verlag",

}

TY - JOUR

T1 - Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches

AU - Bockstedte, M

AU - Gali, A

AU - Mattausch, A

AU - Pankratov, O

AU - Steeds, JW

N1 - Publisher: Wiley Interscience Other: Special Issue: Silicon Carbide: Current Trends in Research and Applications

PY - 2008/6

Y1 - 2008/6

U2 - 10.1002/pssb.200844048

DO - 10.1002/pssb.200844048

M3 - Article (Academic Journal)

VL - 245(7)

SP - 1281

EP - 1297

JO - physica status solidi (b)

JF - physica status solidi (b)

SN - 0370-1972

ER -