Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches

M Bockstedte, A Gali, A Mattausch, O Pankratov, JW Steeds

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionIdentification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches
Original languageEnglish
Pages (from-to)1281 - 1297
Number of pages17
Journalphysica status solidi (b)
Volume245(7)
DOIs
Publication statusPublished - Jun 2008

Bibliographical note

Publisher: Wiley Interscience
Other: Special Issue: Silicon Carbide: Current Trends in Research and Applications

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