Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms

Sam Walder, Xibo Yuan, Ian Laird, Jeremy Dalton

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

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Abstract

Certain Electromagnetic Interference (EMI) performance characteristics that occur in data taken from practical systems are often difficult to attribute to time domain features as waveforms will tend to deviate from the idealized analytical case. This paper shows that by taking multiple derivatives of experimental data and comparing this with the expected characteristics of a typical switching waveform it is possible to understand exactly which features of a given temporal waveform lead to certain spectral characteristics. It is also shown through analysis of analytical methods and experimental data that the smoother the transitions of a waveform the faster the roll off of the spectral content and hence the better the EMI performance.
Original languageEnglish
Title of host publication2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016)
Subtitle of host publicationProceedings of a meeting held 18-22 September 2016, Milwaukee, Wisconsin, USA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages3715-3722
Number of pages8
ISBN (Electronic)9781509007370
ISBN (Print)9781509007387
DOIs
Publication statusPublished - Apr 2017

Keywords

  • EMI
  • Silicon Carbide
  • Spectral Analysis

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