Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms

Sam Walder; Xibo Yuan; Ian Laird; Jeremy Dalton

doi:10.1109/ECCE.2016.7855180

Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms

Sam Walder
, Xibo Yuan
, Ian Laird
, Jeremy Dalton

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

25 Citations (Scopus)

636 Downloads (Pure)

Abstract

Certain Electromagnetic Interference (EMI) performance characteristics that occur in data taken from practical systems are often difficult to attribute to time domain features as waveforms will tend to deviate from the idealized analytical case. This paper shows that by taking multiple derivatives of experimental data and comparing this with the expected characteristics of a typical switching waveform it is possible to understand exactly which features of a given temporal waveform lead to certain spectral characteristics. It is also shown through analysis of analytical methods and experimental data that the smoother the transitions of a waveform the faster the roll off of the spectral content and hence the better the EMI performance.

Original language	English
Title of host publication	2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016)
Subtitle of host publication	Proceedings of a meeting held 18-22 September 2016, Milwaukee, Wisconsin, USA
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	3715-3722
Number of pages	8
ISBN (Electronic)	9781509007370
ISBN (Print)	9781509007387
DOIs	https://doi.org/10.1109/ECCE.2016.7855180
Publication status	Published - Apr 2017

Keywords

EMI
Silicon Carbide
Spectral Analysis

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Walder, S., Yuan, X., Laird, I., & Dalton, J. (2017). Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms. In 2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016): Proceedings of a meeting held 18-22 September 2016, Milwaukee, Wisconsin, USA (pp. 3715-3722). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ECCE.2016.7855180

Walder, Sam ; Yuan, Xibo ; Laird, Ian et al. / Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms. 2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016): Proceedings of a meeting held 18-22 September 2016, Milwaukee, Wisconsin, USA. Institute of Electrical and Electronics Engineers (IEEE), 2017. pp. 3715-3722

@inproceedings{7f8d4228a79042678866ea1b87f4f9c5,

title = "Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms",

abstract = "Certain Electromagnetic Interference (EMI) performance characteristics that occur in data taken from practical systems are often difficult to attribute to time domain features as waveforms will tend to deviate from the idealized analytical case. This paper shows that by taking multiple derivatives of experimental data and comparing this with the expected characteristics of a typical switching waveform it is possible to understand exactly which features of a given temporal waveform lead to certain spectral characteristics. It is also shown through analysis of analytical methods and experimental data that the smoother the transitions of a waveform the faster the roll off of the spectral content and hence the better the EMI performance.",

keywords = "EMI, Silicon Carbide, Spectral Analysis",

author = "Sam Walder and Xibo Yuan and Ian Laird and Jeremy Dalton",

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doi = "10.1109/ECCE.2016.7855180",

language = "English",

isbn = "9781509007387",

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Walder, S, Yuan, X, Laird, I & Dalton, J 2017, Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms. in 2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016): Proceedings of a meeting held 18-22 September 2016, Milwaukee, Wisconsin, USA. Institute of Electrical and Electronics Engineers (IEEE), pp. 3715-3722. https://doi.org/10.1109/ECCE.2016.7855180

Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms. / Walder, Sam; Yuan, Xibo; Laird, Ian et al.
2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016): Proceedings of a meeting held 18-22 September 2016, Milwaukee, Wisconsin, USA. Institute of Electrical and Electronics Engineers (IEEE), 2017. p. 3715-3722.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms

AU - Walder, Sam

AU - Yuan, Xibo

AU - Laird, Ian

AU - Dalton, Jeremy

PY - 2017/4

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N2 - Certain Electromagnetic Interference (EMI) performance characteristics that occur in data taken from practical systems are often difficult to attribute to time domain features as waveforms will tend to deviate from the idealized analytical case. This paper shows that by taking multiple derivatives of experimental data and comparing this with the expected characteristics of a typical switching waveform it is possible to understand exactly which features of a given temporal waveform lead to certain spectral characteristics. It is also shown through analysis of analytical methods and experimental data that the smoother the transitions of a waveform the faster the roll off of the spectral content and hence the better the EMI performance.

AB - Certain Electromagnetic Interference (EMI) performance characteristics that occur in data taken from practical systems are often difficult to attribute to time domain features as waveforms will tend to deviate from the idealized analytical case. This paper shows that by taking multiple derivatives of experimental data and comparing this with the expected characteristics of a typical switching waveform it is possible to understand exactly which features of a given temporal waveform lead to certain spectral characteristics. It is also shown through analysis of analytical methods and experimental data that the smoother the transitions of a waveform the faster the roll off of the spectral content and hence the better the EMI performance.

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KW - Silicon Carbide

KW - Spectral Analysis

U2 - 10.1109/ECCE.2016.7855180

DO - 10.1109/ECCE.2016.7855180

M3 - Conference Contribution (Conference Proceeding)

SN - 9781509007387

SP - 3715

EP - 3722

BT - 2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016)

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -

Walder S, Yuan X, Laird I, Dalton J. Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms. In 2016 IEEE Energy Conversion Congress and Exposition (ECCE 2016): Proceedings of a meeting held 18-22 September 2016, Milwaukee, Wisconsin, USA. Institute of Electrical and Electronics Engineers (IEEE). 2017. p. 3715-3722 Epub 2017 Feb 16. doi: 10.1109/ECCE.2016.7855180

Identification of the temporal source of frequency domain characteristics of SiC MOSFET based power converter waveforms

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