Impact of well contacts on the single event response of radiation-hardened 40-nm flip-flops

Indranil Chatterjee, Srikanth Jagannathan, Daniel Loveless, Bharat L Bhuva, S Wen, Richard Wong, Manoj Sachdev

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

5 Citations (Scopus)
Original languageEnglish
Title of host publicationReliability Physics Symposium (IRPS), 2012 IEEE International
Publication statusPublished - 2012

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