Original language | English |
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Title of host publication | Reliability Physics Symposium (IRPS), 2012 IEEE International |
Pages | SE-4 |
Publication status | Published - 2012 |
Impact of well contacts on the single event response of radiation-hardened 40-nm flip-flops
Indranil Chatterjee, Srikanth Jagannathan, Daniel Loveless, Bharat L Bhuva, S Wen, Richard Wong, Manoj Sachdev
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
5
Citations
(Scopus)