Impact of well contacts on the single event response of radiation-hardened 40-nm flip-flops

Indranil Chatterjee, Srikanth Jagannathan, Daniel Loveless, Bharat L Bhuva, S Wen, Richard Wong, Manoj Sachdev

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

5 Citations (Scopus)

Original language	English
Title of host publication	Reliability Physics Symposium (IRPS), 2012 IEEE International
Pages	SE-4
Publication status	Published - 2012

Cite this

@inproceedings{872f95066a494b208182ebc65d3fe481,

title = "Impact of well contacts on the single event response of radiation-hardened 40-nm flip-flops",

author = "Indranil Chatterjee and Srikanth Jagannathan and Daniel Loveless and Bhuva, {Bharat L} and S Wen and Richard Wong and Manoj Sachdev",

year = "2012",

language = "English",

pages = "SE--4",

booktitle = "Reliability Physics Symposium (IRPS), 2012 IEEE International",

}

Impact of well contacts on the single event response of radiation-hardened 40-nm flip-flops. / Chatterjee, Indranil; Jagannathan, Srikanth; Loveless, Daniel; Bhuva, Bharat L; Wen, S; Wong, Richard; Sachdev, Manoj.

Reliability Physics Symposium (IRPS), 2012 IEEE International. 2012. p. SE-4.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Impact of well contacts on the single event response of radiation-hardened 40-nm flip-flops

AU - Chatterjee, Indranil

AU - Jagannathan, Srikanth

AU - Loveless, Daniel

AU - Bhuva, Bharat L

AU - Wen, S

AU - Wong, Richard

AU - Sachdev, Manoj

PY - 2012

Y1 - 2012

M3 - Conference Contribution (Conference Proceeding)

SP - SE-4

BT - Reliability Physics Symposium (IRPS), 2012 IEEE International

ER -