Original language | English |
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Pages (from-to) | 704-705 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | 3 |
DOIs | |
Publication status | Published - 1 Jan 2014 |
Importance of carbon contamination in high-resolution (FEG) EPMA of silicate minerals
Ben Buse, Stuart L. Kearns
Research output: Contribution to journal › Article (Academic Journal) › peer-review