Importance of carbon contamination in high-resolution (FEG) EPMA of silicate minerals

Research output: Contribution to journal › Article (Academic Journal) › peer-review

5 Citations (Scopus)

Original language	English
Pages (from-to)	704-705
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614005248
Publication status	Published - 1 Jan 2014

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@article{8134960faff5446788a0448b597eda14,

title = "Importance of carbon contamination in high-resolution (FEG) EPMA of silicate minerals",

author = "Ben Buse and Kearns, {Stuart L.}",

year = "2014",

month = jan,

day = "1",

doi = "10.1017/S1431927614005248",

language = "English",

volume = "20",

pages = "704--705",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

}

TY - JOUR

T1 - Importance of carbon contamination in high-resolution (FEG) EPMA of silicate minerals

AU - Buse, Ben

AU - Kearns, Stuart L.

PY - 2014/1/1

Y1 - 2014/1/1

UR - http://www.scopus.com/inward/record.url?scp=84921414194&partnerID=8YFLogxK

U2 - 10.1017/S1431927614005248

DO - 10.1017/S1431927614005248

M3 - Article (Academic Journal)

AN - SCOPUS:84921414194

VL - 20

SP - 704

EP - 705

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -