Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy

Oliver D Payton, Loren M Picco, Mervyn J Miles, Martin E Homer, Alan R Champneys

Research output: Contribution to journalArticle (Academic Journal)peer-review

13 Citations (Scopus)

Abstract

During high-speed contact mode atomic force microscopy, higher eigenmode flexural oscillations of the cantilever have been identified as the main source of noise in the resultant topography images. We show that by selectively filtering out the frequencies corresponding to these oscillations in the time domain prior to transforming the data into the spatial domain, significant improvements in image quality can be achieved.
Original languageEnglish
Article number083710
JournalReview of Scientific Instruments
Volume83
Issue number8
DOIs
Publication statusPublished - 2012

Structured keywords

  • Engineering Mathematics Research Group

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  • Ionic solutions of two-dimensional materials

    Cullen, P., Cox, K., Subhan, M., Picco, L., Payton, O., Buckley, D., Miller, T., Hodge, S., Skipper, N. T., Tileli, V. & Howard, C., Mar 2017, In: Nature Chemistry. 9, 3, p. 244–249 6 p.

    Research output: Contribution to journalArticle (Academic Journal)peer-review

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