Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy

Oliver D Payton; Loren M Picco; Mervyn J Miles; Martin E Homer; Alan R Champneys

doi:10.1063/1.4747455

Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy

Oliver D Payton
, Loren M Picco
, Mervyn J Miles
, Martin E Homer
, Alan R Champneys

Research output: Contribution to journal › Article (Academic Journal) › peer-review

16 Citations (Scopus)

Abstract

During high-speed contact mode atomic force microscopy, higher eigenmode flexural oscillations of the cantilever have been identified as the main source of noise in the resultant topography images. We show that by selectively filtering out the frequencies corresponding to these oscillations in the time domain prior to transforming the data into the spatial domain, significant improvements in image quality can be achieved.

Original language	English
Article number	083710
Journal	Review of Scientific Instruments
Volume	83
Issue number	8
DOIs	https://doi.org/10.1063/1.4747455
Publication status	Published - 2012

Research Groups and Themes

Engineering Mathematics Research Group

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10.1063/1.4747455

http://scitation.aip.org/content/aip/journal/rsi/83/8/10.1063/1.4747455

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16 Citations
1 Article (Academic Journal)

Ionic solutions of two-dimensional materials
Cullen, P., Cox, K., Subhan, M., Picco, L., Payton, O., Buckley, D., Miller, T., Hodge, S., Skipper, N. T., Tileli, V. & Howard, C., Mar 2017, In: Nature Chemistry. 9, 3, p. 244–249 6 p.
Research output: Contribution to journal › Article (Academic Journal) › peer-review

Open Access
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74 Citations (Scopus)

576 Downloads (Pure)

2 Finished

ANM: MAKING IT REAL
Hogan, J. (Principal Investigator)
1/10/07 → 1/04/12
Project: Research
ULTRA HIGH SPEEDS NON-CONTACT FORCE MICROSCOPY
Miles, M. J. (Principal Investigator)
1/10/04 → 1/10/09
Project: Research

Various High Speed Atomic Force Microscope
Miles, M. J.
University of Bristol
Facility/equipment: Equipment

Cite this

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title = "Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy",

abstract = "During high-speed contact mode atomic force microscopy, higher eigenmode flexural oscillations of the cantilever have been identified as the main source of noise in the resultant topography images. We show that by selectively filtering out the frequencies corresponding to these oscillations in the time domain prior to transforming the data into the spatial domain, significant improvements in image quality can be achieved.",

author = "Payton, \{Oliver D\} and Picco, \{Loren M\} and Miles, \{Mervyn J\} and Homer, \{Martin E\} and Champneys, \{Alan R\}",

year = "2012",

doi = "10.1063/1.4747455",

language = "English",

volume = "83",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

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AU - Payton, Oliver D

AU - Picco, Loren M

AU - Miles, Mervyn J

AU - Homer, Martin E

AU - Champneys, Alan R

PY - 2012

Y1 - 2012

N2 - During high-speed contact mode atomic force microscopy, higher eigenmode flexural oscillations of the cantilever have been identified as the main source of noise in the resultant topography images. We show that by selectively filtering out the frequencies corresponding to these oscillations in the time domain prior to transforming the data into the spatial domain, significant improvements in image quality can be achieved.

AB - During high-speed contact mode atomic force microscopy, higher eigenmode flexural oscillations of the cantilever have been identified as the main source of noise in the resultant topography images. We show that by selectively filtering out the frequencies corresponding to these oscillations in the time domain prior to transforming the data into the spatial domain, significant improvements in image quality can be achieved.

U2 - 10.1063/1.4747455

DO - 10.1063/1.4747455

M3 - Article (Academic Journal)

C2 - 22938306

SN - 0034-6748

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 8

M1 - 083710

ER -

Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy

Abstract

Research Groups and Themes

Access to Document

Handle.net

Fingerprint

Research output

Ionic solutions of two-dimensional materials

Projects

ANM: MAKING IT REAL

ULTRA HIGH SPEEDS NON-CONTACT FORCE MICROSCOPY

Equipment

Various High Speed Atomic Force Microscope

Cite this