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In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction
A Steuwer, L Edwards, S Pratihar, S Ganguly, MJ Peel, ME Fitzpatrick, TJ Marrow, PJ Withers, I Sinclair, KD Singh, N Gao, T Buslaps, JY Buffiere
Research output: Contribution to journal › Article (Academic Journal) › peer-review
57
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(Scopus)